X-Ray Diffraction (XRD) is a powerful technique for identifying and quantifying crystalline phases in a material. Using our SmartLab SE Rigaku XRD equipment (with SAXS unit), we provide accurate phase identification, quantification, crystallinity analysis, and thin film characterization.
What this analysis provides:
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Phase identification (crystalline phases present)
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Phase quantification (using Rietveld refinement)
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Percent crystallinity (differentiates crystalline vs amorphous phases)
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Crystallite size & lattice parameters (relevant for nanomaterials)
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Thin film texture & phase analysis (Grazing Incidence XRD)
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SAXS for small angle scattering studies
Sample Requirements:
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Quantity: 2–5 gm
Analysis Duration:
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6–8 working days (after receipt of payment)
Delivery:
Report will be sent via email. (hard copy available on request)
